Microanalysis


Element

The Element Energy Dispersive Spectroscopy (EDS) System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon Drift Detector (SDD) with the user friendly APEX™ software provides a complete EDS microanalysis solution for all levels of analysis and high throughput industrial applications.
The design of the SDDs with the materials properties and durability of the Si3N4 window offer the most robust and reliable detectors for EDS applications. The unique module design means that they are corrosion and shock resistant and suitable for plasma cleaning.

 

 

  • Element SDD – 30 mm2
  • Si3N4 window
  • 129 eV resolution at Mn K
  • Hermetically sealed vacuum encapsulated module
  • X-ray Input > 1M cps
  • Throughput > 300 kcps
  • Peak/Background > 10,000/1
  • Stable resolution
  • Detection range: Be to Am
  • Thermoelectric Peltier cooling (fan and LN free)
  • Fixed or manual slide options

Octane Elect


The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.

The Octane Elect SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a manual slide. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras as part of the Pegasus EDS-EBSD Analysis System, providing seamless integration for both elemental composition and crystal structure analysis in one easy-to-use package.
The design enhancements and analytical benefits of the EDAX EDS Systems advance SDD technology to the highest level of performance. The Octane Elect EDS System offers users great value and sophisticated

solutions to meet their materials characterization challenges with the best results.

The Octane Elect SDDs are available in 2 models:
Octane Elect Plus – 30 mm2 chip
Octane Elect Super – 70 mm2 chip

  • Octane Elect SDD options:

– Plus (30 mm2)

– Super (70 mm2)

  • 127 eV resolution at Mn K
  • Carbon detection: >500 k cps for ultra fast mapping and particle acquisition
  • Detection range: AL L (73 eV) – Am
  • Throughput: 850 k ocps at 1.6 M icps
  • Cooling: Peltier
  • Al L to Al K peak height ratio of 1:1 at 2.5 kV
  • Standard with EDS Analysis Software

– Fast Phase Mapping routine (patent pending) and materials libraries

– Smart Diagnostics

– Smart Acquisition

– EXpert ID

– Smart Mapping

– Smart Data Management


Octane Elite

The game changing advancements in the Octane Elite EDS System with Octane Elite Silicon Drift Detector (SDDs) takes Energy Dispersive Spectroscopy (EDS) analysis to the next level. This system includes detectors which incorporate a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device. The Octane Elite SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a motorized slide. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras and/or Wavelength Dispersive Spectrometry (WDS) detectors as part of the Pegasus EDS-EBSD Analysis System or Trident EDS-EBSD-WDS Analysis System for a complete materials characterization solution.
The design enhancements and analytical benefits of the Octane Elite EDS System ensure that t remains the platinum standard for analysts who face materials characterization challenges that demand the full range of analysis options.

The Octane Elite SDDs are available in 2 models:
Octane Elite Plus – 30 mm2 chip
Octane Elite Super – 70 mm2 chip

  • Octane Elite SDD options:

– Plus (30 mm2)

– Super (70 mm2)

  • 125 eV resolution at Mn K

– 123 eV premium option

  • Carbon detection above 750 K input cps for ultra fast mapping and particle acquisition
  • Detection range Al L (73 eV) to Am
  • Throughput – 850 k ocps at 2.0 M icps
  • Al L to Al K peak height ratio of 1:1 at 2.5 kV
  • Cooling: Peltier
  • Standard with EDS Analysis Software

– Fast Phase Mapping routine (patent pending) and materials libraries

– Smart Diagnostics

– Smart Acquisition

– EXpert ID

– Smart Mapping

– Smart Data Management