BenchTop Turbo for thermal evaporation
The flexible and compact BenchTop Turbo for thermal evaporation and sample preparation is a powerful, versatile high vacuum evaporation and sputtering system. It is capable of full-range, low-voltage (resistive) thermal evaporation and can produce fine-grained thin films via sputtering for high resolution microscopy applications. The BenchTop Turbo can support up to two sources with optional […]
BenchTop Turbo for thermal evaporation
The flexible and compact BenchTop Turbo for thermal evaporation and sample preparation is a powerful, versatile high vacuum evaporation and sputtering system. It is capable of full-range, low-voltage (resistive) thermal evaporation and can produce fine-grained thin films via sputtering for high resolution microscopy applications. The BenchTop Turbo can support up to two sources with optional […]
EM-30AX PLUS
The scanning electron microscope EM-30AX Plus is the advanced version of the ductile EM30PLus for morphological analyses. It is the evolution of the COXEM traditional SEM, easy to use and miniaturized as a table-top instrument, but able to provide performances comparable with those of a much more expensive traditional SEM. The main difference between the […]
FEMTO 3D AO
Femto3D-AcoustoOptic microscope is the first fast, 3D, two-photon microscope on the market. The microscope is capable of scanning neuronal, dendritic, and other neuropil activities about one million faster as compared to previous realizations within a large (about cubic millimeter) scanning volume with preserved two-photon resolution. The microscope, using electrically tunable crystals, can focus the excitation […]
FEMTO 3D AO
Femto3D-AcoustoOptic microscope is the first fast, 3D, two-photon microscope on the market. The microscope is capable of scanning neuronal, dendritic, and other neuropil activities about one million faster as compared to previous realizations within a large (about cubic millimeter) scanning volume with preserved two-photon resolution. The microscope, using electrically tunable crystals, can focus the excitation […]
Premium acoustic blast chillers for laboratories
SBox: Containers for noise reduction The blast chillers have been specifically developed to reduce the noise level generated by vacuum pumps and water chillers (water controllers or chillers) used with SEM, TEM, FIB-SEM, sample preparation and analytical systems. If there is no possibility of moving the vacuum pumps and/or the water cooler to a separate […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
APT – Atom Probe Tomography
Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is […]
3D Cell Explorer-Fluo
The 3D Cell Explorer-Fluo or “CX-F” is a powerful microscope able to meet your scientific requirements, combining the advantages of the in vivo, non invasive, 3D cellular tomography with the multicanal epifluorescence without labels. This live cell imaging instrument employs a completely label free technique. The CX-F holotomographic microscope allows to combine non invasive 3D […]
DigiView EBSD Camera
The DigiView is a versatile high resolution digital camera.The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating, resulting in higher sensitivity for electron backscatter diffraction (EBSD) applications. Noise is significantly reduced using a single stage Peltier cooling system that does not […]
DigiView EBSD Camera
The DigiView is a versatile high resolution digital camera.The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating, resulting in higher sensitivity for electron backscatter diffraction (EBSD) applications. Noise is significantly reduced using a single stage Peltier cooling system that does not […]
DigiView EBSD Camera
The DigiView is a versatile high resolution digital camera.The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating, resulting in higher sensitivity for electron backscatter diffraction (EBSD) applications. Noise is significantly reduced using a single stage Peltier cooling system that does not […]
DigiView EBSD Camera
The DigiView is a versatile high resolution digital camera.The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating, resulting in higher sensitivity for electron backscatter diffraction (EBSD) applications. Noise is significantly reduced using a single stage Peltier cooling system that does not […]
FEMTO 3D AO
Femto3D-AcoustoOptic microscope is the first fast, 3D, two-photon microscope on the market. The microscope is capable of scanning neuronal, dendritic, and other neuropil activities about one million faster as compared to previous realizations within a large (about cubic millimeter) scanning volume with preserved two-photon resolution. The microscope, using electrically tunable crystals, can focus the excitation […]
FEMTO 3D AO
Femto3D-AcoustoOptic microscope is the first fast, 3D, two-photon microscope on the market. The microscope is capable of scanning neuronal, dendritic, and other neuropil activities about one million faster as compared to previous realizations within a large (about cubic millimeter) scanning volume with preserved two-photon resolution. The microscope, using electrically tunable crystals, can focus the excitation […]
FEMTO 3D AO
Femto3D-AcoustoOptic microscope is the first fast, 3D, two-photon microscope on the market. The microscope is capable of scanning neuronal, dendritic, and other neuropil activities about one million faster as compared to previous realizations within a large (about cubic millimeter) scanning volume with preserved two-photon resolution. The microscope, using electrically tunable crystals, can focus the excitation […]
SIMS – KLEORA
The Specialized Ion Microprobe for World-leading Research in Geochronology In order to meet a growing demand from geochronologists, CAMECA has introduced KLEORA, a large geometry SIMS instrument fully optimized for advanced U-Th-Pb mineral dating. Based on the new generation ultra-high sensitivity large geometry IMS 1300-HR³ ion microprobe, KLEORA provides benchmark sensitivity for in-situ U-Th-Pb isotopic analyses in […]
LVEM25
The LVEM25 is a fast, compact and powerful transmission electron microscope engineered to seamlessly blend a compact form factor with uncompromised capabilities. This microscope combines the unique LVEM technical features with stronger electron beam penetration and is thus able to image conventionally prepared samples. The LVEM25 is compact enough to be installed in any sized lab […]
CX200Plus
The scanning electron microscope CX200Plus is the evolution of the traditional COXEM SEM. CX200Plus is a powerful and easy to use SEM, able to reach 3nm resolution, to analyze every kind of sample. The traditional COXEM scanning electron microscope is used for a variety of applications, ranging from materials science to life science, always granting […]
CX200Plus
The scanning electron microscope CX200Plus is the evolution of the traditional COXEM SEM. CX200Plus is a powerful and easy to use SEM, able to reach 3nm resolution, to analyze every kind of sample. The traditional COXEM scanning electron microscope is used for a variety of applications, ranging from materials science to life science, always granting […]
CX200Plus
The scanning electron microscope CX200Plus is the evolution of the traditional COXEM SEM. CX200Plus is a powerful and easy to use SEM, able to reach 3nm resolution, to analyze every kind of sample. The traditional COXEM scanning electron microscope is used for a variety of applications, ranging from materials science to life science, always granting […]
3D Cell Explorer-Fluo
The 3D Cell Explorer-Fluo or “CX-F” is a powerful microscope able to meet your scientific requirements, combining the advantages of the in vivo, non invasive, 3D cellular tomography with the multicanal epifluorescence without labels. This live cell imaging instrument employs a completely label free technique. The CX-F holotomographic microscope allows to combine non invasive 3D […]
EM-30AX PLUS
The scanning electron microscope EM-30AX Plus is the advanced version of the ductile EM30PLus for morphological analyses. It is the evolution of the COXEM traditional SEM, easy to use and miniaturized as a table-top instrument, but able to provide performances comparable with those of a much more expensive traditional SEM. The main difference between the […]
EM-Tec stub storage boxes for 9.5mm and 12.2mm JEOL cylinder stubs
The EM-Tec JEOL stub storage boxes and are designed for storing SEM samples mounted on the 9.5mm and 12,2mm diameter JEOL cylinder stubs. They can be used for handling, long term storage, archiving and shipping SEM samples on smaller JEOL stubs and mounts. Currently available as storage boxes for 4 stubs and 12 stubs: EM-Tec […]
EM-Tec transmission-EBSD sample holders for TEM and FIB grids
EBSD analysis is a powerful microstructural crystallographic characterisation technique for crystalline or polycrystalline materials. Standard EBSD analysis on bulk samples and surfaces is performed on high-tilt samples (typically 70° from horzontal). The EBSD pattern reveals the crystal orientation and in polycrystalline materials the variation of orientation amongst the crystals. For optimum EBSD results, deformation free, […]
EM-Tec filter disc holders for SEM / EDS analysis
The EM-Tec filter disc holders are developed to hold flat discs type filters to enable SEM / EDS analysis. The EM-Tec filter disc holders comprise of two parts; a flat base plate to hold the filter disc and a cap which acts as clamping ring to keep the filter flat on the base. The cap […]
EM-Tec XT SEM stage travel extender strips
With the EM-Tec XT extender strips, sample area coverage can be increased to 100x100mm for SEMs with smaller SEM sample stages. The EM-Tec XT extender strip off-sets the large sample holder (EM-Tec XL100 multi holder). This enables coverage of a larger sample area by scanning half the area of the EM-Tec XL100 holder and than […]
EM-Tec Versa-Plate adaptable SEM sample holders
The EM-Tec Versa-Plate adaptable SEM sample holders consists of a flat base plate with multiple M4 threaded holes and a set of movable sample holding brackets. The brackets can be positioned at any of the M4 threaded holes to perfectly suit the size and shape of the sample. Each bracket can be rotated a fully […]
EM-Tec U2 universal SEM sample holder and SEM stubs adapter kit
The EM-Tec U2 universal SEM sample holder and SEM stub adapter kit has been created to hold a wide variety of SEM samples up to 42mm. The samples can be flat, round, block or akwardly shaped. Also included in this kit is a useful selection of SEM stub adapters which enables using this kit on […]
EM-Tec wafer holders for SEM
The EM-Tec wafer holders are specially designed to hold semi-conductor wafer in sizes of 51mm, 76mm, 100mm, 150mm and 200mm diameter (2 inch, 3inch, 4 inch, 6 inch and 8 inch). They are compatible with wafers with either a flat or with a notch. The unique locking slide is adjustable to cope with non-standard wafers. […]
EM-Tec gripping stub and stub based vise holders
The EM-Tec gripping stub and stub based vise holders are useful to grip and hold SEM samples without much need for sample preparation. Ideal for cross-section and edge-on imaging. The comprehensive selection of this type of cost-effective gripping and vise type holders is compatible with SEMs using pin stubs (FEI, Zeiss, Tescan, Phenom, Aspex), SEMs […]
EM-Tec multiple stub holders for Hitachi cylinder SEM stubs
The Em-Tec multiple stub holders are an economical and pragmatic way to load multiple Hitachi sample stubs with specimens in the SEM. Using multiple stub holders saves time, allows multi sample processing or allows for quickly comparing samples against each other. The following types are offered: EM-Tec H3 multiple stub holders for 3 x Ø15mm […]
EM-Tec multiple stub holders for JEOL SEM cylinder stubs
The EM-Tec multiple stub holders offer an efficient and cost-effective way to load multiple sample stubs with specimens in the SEM. Using multiple stub holders saves time, allows multi sample processing or allows for quickly comparing samples against each other. Three types are offered: EM-Tec J4 multiple stub holders for 4 of the Ø9.5mm JEOL […]
EM-Tec metallographic mount holders
The EM-Tec metallographic mount holders are designed to hold metallographic, petrographic and ceramographic mounts or embeddings. These practical and sturdy holders are equally useful holding round samples with size similar to the mounts or for holding larger cylindrical specimen stubs. Available for all standard metallurgical mounts from 25 to 50mm diameter (1” to 2”). The […]
EM-Tec Multiple pin stub holders
The EM-Tec multiple pin stub holders are an efficient and cost-effective way to load multiple pin stubs with specimens in the SEM. Saves time, allows multi sample processing or quickly comparing samples against each other. Intended for holding the standard 12.7mm (1/2”) pin stubs, although the larger 25.4mm (1”)pin stubs can be used on the […]
EM-Tec bulk SEM sample holders
The EM-Tec bulk sample holders are designed to hold awkwardly shaped and bulk samples. These sample holders are either rectangular or round and have brackets with screws to securely hold the sample in place. The bulk sample holders are a cost-effective and practical way to hold smaller to medium size samples. They are either made […]
EM-Tec FIB grid holders and FIB grid + sample holders
The EM-Tec FIB grid holders are designed to hold FIB grids and provide easy access to the posts on the FIB grids to attach the milled FIB lift-out lamellae. The FIB grid holders can be used in the FIB/SEM systems but also for safe storage of the FIB grids with attached lamellae. The EM-Tec FIB […]
EM-Tec TEM grid holders and STEM imaging holders
TEM samples are very thin and therefore don’t exhibit signal originating from bulk. This enables improved surface imaging and increased spatial resolution. These are clear advantages for SEM/EDX studies of thin films, fine dispersions, inclusions, precipitations and low-Z materials. An SEM or rather FESEM can also be used to check TEM samples or lamellas made […]
EM-Tec top reference holders for metallographic mounts
The EM-Tec top reference holders ensure the same focus conditions for the SEM and same take-off angle for the X-ray analysis system the for all mounts in the holder. They have been designed for SEM/EDS/WDS analysis on multiple metallographic and petrographic mounts. The mounts are placed against three reference lips and secured with screws from […]
EM-Tec gold series SEM sample holders and pin stub adapters
The EM-Tec gold series SEM sample holders comprises a selection of compact SEM sample holders, all made from brass and plated with 1µm of pure gold. Brass is chosen for greater strength and is fully non-magnetic. The gold plating assists in keeping the sample holders clean during handling. The superior chemical resistance of the gold […]
EM-Tec geological thin section and slide holders
The EM-Tec geological thin section or petrographic slide holders are especially designed to securely hold geological thin sections on petrographic slides for imaging and analysis with an SEM, EPMA or specially configured mineral analyzers. They are used for SEM/EDS imaging and analysis in geology, mineralogy and petrography. The EM-Tec thin section holders are compatible with […]
EM-Tec versatile 360°/90° off-set sample holder and 90° Quick-Flip holders
90 Degrees sample holder and 90 degrees quick-flip kitsThe EM-Tec PH90 versatile off-set and 360°/90°-offset sample holder kit allows for imaging samples and samples mounted on sample stubs directly under 90° tilt w/o disturbing background. The 90° sample holder kit has a low profile and small volume to reduce interference with detectors. With the 90° pre-tilt there is […]
EM-Tec compact and universal vise sample holders
Vise type sample holders are quick and easy to use. They hold the sample by clamping it between the moving jaws, this enables quick sample loading and reduces down time. They especially useful when similar samples or series of the same sample need to be examined. Using a vise sample holder is easier, quicker and cleaner […]
EM-Tec SEM swivel tilt sample holders
The EM-Tec swivel sample holders enable full tilting both ways in any direction. This is ideal for viewing samples at multiple angles, even offering tilt directions normally not available on your SEM. The EM-Tec swivel tilt sample holders are ideal for adding tilt facilities on table top SEMs. The EM-Tec swivel sample holders include a […]
EM-Tec EBSD & t-EBSD pre-tilt sample holders and sample holder kits
The EM-Tec EBSD pre-tilt sample holders all include a 70° pre-tilt angle to facilitate EBSD analysis. With a 70° pre-tilt angle there is no need to tilt the SEM sample stage. Using 70° pre-tilted holders instead of tilting the SEM stage offer definite advantages: Correct EBSD angle when loading sample No stage drift in Z-direction Choice […]
EM-Tec CV1 large centering vise SEM sample holder
The EM-Tec CV1 large centering vise SEM sample holder comprises a unique advantage. It keeps the sample always clamped in the centre of the holder. Both vise clamp jaws simultaneously move away or to the centre of the holder at the same time. The EM-Tec CV1 large centering vise clamp includes two base plates on […]
EM-Tec Low Profile S-Clip SEM sample holders
The EM-Tec Low Profile S-Clip SEM sample holders have been developed to allow for very short working distance and high tilt of thin samples. The Low-Profile S-Clip holders can be used to clamp thin samples, such as Silicon chips, up to 1mm thickness. The EM-Tec Low Profile S-Clips are positioned in the narrow precision slots […]
EM-Tec variable tilt and pre-tilt angle holders
The EM-Tec variable tilt and pre-tilt holders are useful for imaging samples under a pre-tilt angle without having to tilt the SEM stage. With these holders you can image previously mounted samples on standard pin stubs or Hitachi stubs at pre-set angles or any chosen angle. The tilt holders are particularly useful for table top […]
EM-Tec S-Clip SEM sample holders
The EM-Tec S-Clip sample holders all comprise one or more springloaded sample clips (S-Clips) either on an SEM sample stub or a SEM sample holder. The springloaded S-clips are specifically designed to hold thin specimens up to 2mm on a holder. Optional stand-off pillars are available to accomodate thicker samples. Small washers can also be […]
EM-Tec versatile vise clamp sample holders
The EM-Tec versatile vise clamp holders are large vise clamp sample holders with positionable vise clamp plates. These sample holders can accommodate large and heavy samples or even multiple samples. They are designed for SEMs with large sample stages which can cope with larger and or heavier samples. The EM-Tec versatile vise clamp holders consist […]
EM-Tec versatile SEM stage adapters for Zeiss / LEO SEMs, FESEMS and CrossBeam systems
The EM-Tec versatile SEM stage adapters for Zeiss / LEO SEMs and FIB-SEM systems have been designed to original manufacturer’s specifications and is compatible with all M4 threaded EM-Tec SEM sample holders. The EM-Tec ZV9 and EM-Tec ZV11 versatile stage adapters for Zeiss / LEO SEMs, FESEMs, CrossBeams and FIB-SEM systems give access to an […]
EM-Tec versatile SEM stage adapters for FEI/Philips SEM, FESEM, FIB, FIB-SEM systems
EM-Tec versatile SEM stage adapters for FEI/Philips SEM, FESEM, FIB, FIB-SEM systems are offered with two different styles and a variety of heights: EM-Tec versatile SEM stage adapters with 20, 40 and 50mm height and M4 screw OEM compatible SEM stage adapters with 20, 40 and 50mm height and fine M6 thread FEI/Philips type EM-Tec […]
EM-Tec versatile SEM stage adapters JEOL SEMs, FESEMs and FIB-SEM systems
The EM-Tec versatile SEM stage adapters for JEOL systems are all designed to original SEM manufacturer’s specifications and are available as: JEOL JV stage adapter with M4 screw; compatible with all EM-Tec SEM sample holders with M4 thread JEOL JV-P stage adapters for s pin stubs with standard Ø3.2mm (1/8”) pin JEOL JV-J stage adapters […]
Versatile adattatore da palco SEM EM-Tec per sistemi Hitachi SEM, FESEM, FIB e FIB-SEM
I versatili adattatori per palco SEM EM-Tec per i sistemi Hitachi sono tutti progettati secondo le specifiche del produttore SEM originale e sono pienamente compatibili con i SEM Hitachi, FESEM, FIB, sistemi FIB-SEM e SEM da tavolo TM. Includono tutti una vite M4 per gli stub per campioni Hitachi e per i porta campioni SEM […]
EM-Tec versatile SEM stage adapter for Tescan XM/GM SEM and FIB-SEM
The EM-Tec versatile SEM stage adapter for Tescan SEMs and FIB-SEM systems with the XM or GM sample stages has been designed to original manufacturer’s specifications. The EM-Tec T2M stage adapter is fully compatible with all M4 threaded EM-Tec SEM sample holders. The EM-Tec T2M versatile stage adapter for Tescan XM /GM gives access to […]
EM-Tec versatile SEM stage adapter for Pemtron SEMs
The EM-Tec versatile SEM stage adapter for Pemtron SEMs has been designed to original manufacturer’s specifications and is compatible with all M4 threaded EM-Tec SEM sample holders. The EM-Tec PV64 versatile stage adapter for Pemtron SEMs gives access to an unprecedented choice of SEM sample holders which can be used across multiple SEM platforms. Features […]
EM-Tec versatile SEM stage adapters for Hirox / SEC tabletop SEMs
The EM-Tec versatile SEM stage adapters for Hirox and SEC table top SEMs have been designed to original manufacturer’s specifications and is compatible with all M4 threaded EM-Tec SEM sample holders. The EM-Tec SH2 and SH4 versatile stage adapters for Hirox and SEC SEMs give access to an unprecedented choice of SEM sample holders which […]
Micro-Tec borosilicate glass petri dishes
Micro-Tec borosilicate glass petri dishes for sample preparation and microscopy applications. Made from chemically resistant, low expansion, heat resistant and highly transparent borosilicate glass. Ideal for sample preparation, mixing of small volumes, melting of wax, sorting and sifting. Micro-Tec borosilicate glass is also known under the brand names Pyrex and Duran. The Micro-Tec borosilicate petri […]
Micro-Tec glass cover slips
Premier quality Micro-Tec glass coverslips are made from optically clear and special formulated borosilicate glass. Available in thickness #1 (0.13-0.17) in three popular sizes; 18 x 18mm, 22 x 22mm and 24 x 40mm. Supplied in single packs or boxes of 10 packs (sealed in barrier foil). Main application is microscope cover glass; other applications […]
CMC Correlative Microscopy Coverslips
The CMC Correlative Microscopy Coverslips are made using a polyester based film with unique reticle patterns. They are specifically designed to allow indentification and location of particular areas of interest with brightfield or fluorescence microscopes and then processing for electron microscopy.The material of the CMC correlative microscopy coverslips is compatible with cell culture growth and […]
HOPG Substrates – Highly Ordered Pyrolytic Graphite
HOPG – Highly Ordered Pyrolytic Graphite is a very pure and highly ordered form of synthetic graphite. It is characterised by by the mosaic spread angle. HOPG is a laminar material and consists of layered polycrystals resembling a mosaic of monocrystals grains which are slightly disorientated with respect to each other. The size of the […]
Nano-Tec 90 degrees sample mount and sample holders for AFM and SPM
The Nano-Tec 90 degrees sample mounts are intended for mounting or clamping AFM/SPM samples at 90 degrees to enable easy imaging of cross section or sides of a sample. They are all made from magnetic stainless steel (alloy 430) and can be used on AFM/SPM systems which include a magnet in the sample stage (same […]
Nano-Tec Magnetic Metal Specimen Support Discs for AFM and SPM
Magnetic metal specimen support discs are used on the AFM and SPM systems which employ a button magnet to hold the metal specimen disc. The Nano-Tec metal specimen discs are made of a magnetic type 430 stainless steel with a nominal thickness of 0.90mm and a tolerance of +/- 0.08mm.The smooth edges and flat surfaces […]
Micro-Tec diamond polishing paste
Micro-Tec diamond polishing pastes for polishing and cleaning applications of metals, alloys, glass, ceramics, semiconductors and other hard materials. Also suitable for polishing metallographic and petrographic samples. Oil based formula which can be applied on polishing cloths. The Micro-Tec diamond polishing compound is made from mono-crystalline synthetic diamonds mixed with a mineral and vegetable oil […]
Micro-Tec Applicator sticks and cotton swabs
The Micro-Tec Applicator sticks and cotton swabs are useful for sample preparation, sorting, cleaning and mixing applications. Cotton swabs are available as: Micro-Tec S1 single ended cotton tip applicator with plastic shaft and round tip, 75mm long, supplied in pack of 2000. Micro-Tec SP2 double ended cotton tip applicator with wooden shaft and pointed tips. […]
EM-Tec Nylon gloves and ESD safe polyurethane coated nylon gloves
EM-Tec knitted nylon gloves The EM-Tec knitted nylon gloves are intended for clean handling of sensitive parts, optics, and assemblies without leaving fingerprints. Useful for handling parts for SEM, TEM, FIB or high vacuum systems. The knitted nylon fabric is more comfortable than nitrile or latex gloves. Can be used multiple times, low particle shedding. […]
Nitrile laboratory gloves
High quality, disposable nitrile laboratory gloves which offer a comfortable fit and high sensitivity feel. They are ideal for avoiding contamination when working with SEM / FIB and or TEM. They also offer protecting against chemicals during sample preparation, cleaning and filling rotary pumps with oil. These ambidextrous blue nitrile disposable examination gloves are latex- […]
Micro-Tec ESD safe sticky cleaning swabs
The Micro-Tec ESD safe sticky cleaning swabs are especially designed to remove particles from surfaces. The anti-static treatment of the plastic handles dissipates electrostatic charges, making them suitable for cleaning electrostatic sensitive components. The tip of the Micro-Tec ESD safe sticky cleaning swabs is coated with a soft absorbent gel which picks up particles. With […]
Micro-Tec optical lens tissue
Premium quality Micro-Tec optical lens paper tissue for optical instruments cleaning and EM laboratory applications. Carefully made from new stock to achieve a soft and safe tissue free of mineral and vegetable filler. Lint-free, acid-free, soft but strong tissue which can be used either dry or wet. Useful for many application to protect and clean […]
Micro-Tec preparation tiles, trimming boards and cutting mats
Sample preparation is an integral part of all disciplines of microscopy. For sample which have to cut, processed and prepared, it is imperative to work on a clean, smooth and contamination-free dedicated preparation surface, appropriate for the task at hand. Dedicated preparation surface protect tools and/or the lab bench. Standard laboratory bench surfaces are not […]
EM-Tec cellulose acetate replication sheets
The EM-Tec cellulose acetate replication sheets are used to make replications of surfaces of samples which cannot be easily examined directly. The EM-Tec clear cellulose acetate sheets are provided in several thicknesses to cover a wide range of applications. With scissors, they can be easily cut to size to cover the surface to be replicated.Cellulose […]
Micro-Tec Tablet Press and Tablet Punch Die Kit
Determining the chemical composition of a fine powder with SEM/EDS can be sometimes difficult. Pressing the fine powder into a tablet (if needed with a bonding compound) simplifies handling. By providing a flat surface, the overall analytical results can be improved. It also reduces possible contamination of the SEM with fine powder. If needed the […]
Laboratory Handheld Engraving Tool & Engraving Pen
DM11 Electric Engraving Tool With this electric engraver tool you can easily engrave numbers and markings in a wide variety of materials – from metal to plastic to glass, ceramics and wood. It is a precise and powerful 6000 stroke/minute engraver to engrave permanent identification or reference points on samples, sample holders, tools etc. Ideally […]
Value-Tec hand tools for microscopy, laboratory and R&D
The Value-Tec small hand tools are a selection of practical and cost-effective small hand tools for microscopy, sample preparation repair, laboratory and R&D applications. These are the type of small hand tools which are not readily available in a standard hardware store, but are useful for many sample preparation applications, maintenance and repairs in a […]
Micro-Tec vacuum pick-up tools
Vacuum pick-up tools are ideal for picking up lightweight and flat items without touching them by hand or with sharp tools. Delicate items or surfaces won’t be scratched. Can be used for coverslips, Si substrates, quartz substrates, small componets, parts and samples.The lifting capacity of the vacuum pick-up tools depends on: the vacuum generated in […]
Diamond tipped and tungsten carbide tipped precision scribers
These dedicated scribing tools are useful for marking, engraving and scribing samples, tools and specimen substrates. Available with either a sharp tungsten carbide tip or with diamond tips in various tip angles and styles.The natural diamond tips base sizes are approximately 0.8mm in diameter and vacuum brazed on a tool steel shaft. Scribers can be […]