EM-Tec KF – NW – QF vacuum connection hardware, components and parts
The EM-Tec standard KF vacuum flange hardware components and parts are directly compatible with all KF, NW of QF vacuum flange hardware connections. Interchangeable designations for these standard rough and medium vacuum flange connections are: KF, DN-KF, ISO-KF, NW, ISO-NW, QF and DN. The standard sizes offered are: DN10KF (adapts to DN16KF) DN16KF DN25KF DN40KF […]
Micro-Tec Quick-check vacuum test gauges
The Micro-Tec Quick-check vacuum test gauge enables a quick and easy way to test vacuum performance, test pump-down time and determine leaks in vacuum lines. Since the Micro-Tec Quick-check vacuum gauge doesn’t require an external power source, it is ideal for field applications or in remote locations. The Micro-Tec Quick-check vacuum gauge is equally useful […]
Bullseye Precision Portable Vacuum Gauges
The Bullseye portable precision vacuum gauge presents a new level in portable vacuum measurement. With the robust gauges and rugged control units it offers unrivaled flexibility and connectivity. The Bullseye Bluetooth enabled gauges enable monitoring from mobile devices (Android or Apple), alarm settings and documenting vacuum data. This lightweight unit is easy to use in […]
Micro-Tec Individual Graticule Calibration Standards
The new and innovative Micro-Tec individual graticule calibration standards have been designed using an ultra-flat conductive silicon substrate with corrosion resistant Cr lines. They are manufactured utilizing the latest semiconductor manufacturing techniques. The Micro-Tec graticule calibration standards provide high contrast images for ease of calibration. Each of the calibration standards has a unique product ID […]
Stage micrometers and graticules for light microscopy
These high quality precise stage micrometers are intended for calibration of standard light microscopes, digital microscopes, stereo microscopes and eyepiece reticules. Additional graticules are offered for counting, location finders and test patterns.The patterns are manufactured by vacuum deposited chromium lines on glass. The deposited chromium is wear resistant to ensure long term use. The stage […]
AFM/SPM Calibration Standards and Test Gratings
Atomic Force Microscopy (AFM) has become a valuable tool for imaging and accurate measurements on the micrometer and nanometer scale. In order to validate the measuring capabilities, the AFM system need to be correctly calibrated. On this page you will find a selection of affordable and accurate AFM calibration standards for Z-axis and X-Y-axis calibration: […]
TipCheck sample for checking AFM tips
When imaging a sample surface by AFM, it may be difficult to know wether the surface is imaged accurately or if it is affected by a blunt or broken tip. Blunt or broken tips will dramatically distort measurements like surface roughness or feature dimensions. To be certain that a proper AFM tip is used, they […]
EM-Tec B100 Faraday cup for beam current measurements
The EM-Tec B100 Faraday cup has been designed to enable precise beam current measurements on SEM, FESEM, FIB, EPMA or Microprobe systems. Precise beam current measurement are useful for quantititive X-ray analysis and for consistent and reproducible X-ray mappings and line scans.The EM-Tec B100 features a 100µm diameter hole with a wider cavity inside. This […]
EM-Tec CXS calibration and reference standards for EDS, WDS, BSD, CL and Raman
The EM-Tec CXS calibration and reference standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks.They are available as compact Ø 12.7mm pin stubs and Ø25.4mm discs: Compact Ø12.7mm standard aluminium pin stub with up […]
EM-Tec SEM Resolution Test Standard
Quality resolution standards are essential tools for obtaining optimum resolution, settings, beam size and astigmatism correction on SEM, CD-SEMs, FESEMs, FIB, Microprobe, Auger and SIMS systems. The industry standards are: Gold particles on a carbon substrate Tin spheres on a carbon substrate. Gold particles on carbon have rich features and provide excellent signal strength for […]
EM-Tec M-1 and M-10 Grid Pattern Calibration Standards
The EM-Tec M1 and M-10 calibration standards both have a square mesh type grid pattern etched in the surface of an ultra-flat Si substrate. The grid patterns are practical tools for magnification calibration and image distortion assessments. Intended for use with SEM, FESEM, FIB, Auger, SIMS and reflected light microscopy applications. The specimens can also […]
EM-Tec LAMC-15 large area magnification calibration standard
The unique EM-Tec LAMC-15 calibration standard has been designed for large area and low magnification calibration. It is constructed using an ultra-flat conductive silicon substrate with bright chromium deposited lines. Ideal for SEM and reflected light microscopy with the following applications: low magnification calibration large area magnification calibration particle analysis measurements GSR measurements microscope stage […]
Micro-Tec MTC-5 Multiple Target Graticule Calibration Standards
The new and innovative Micro-Tec MTC-5 multiple target graticule calibration standards have been designed using an ultra-flat conductive silicon substrate with corrosion resistant Chromium lines. The precise patterns are manufactured utilizing the latest semiconductor manufacturing techniques. The Micro-Tec multi target graticules provide bright and rich contrast images for ease of calibration. Intended for use with […]
EM-Tec MCS series magnification calibration standards
The EM-Tec MCS series magnification calibration standards are unique, cost effective, wide range SEM calibration standards. These fullly featured practical calibration standards can be used for magnification calibration or critical dimension measurements in table top SEM, standard SEM, FESEM, FIB, Auger, SIMS and reflected light microscope systems. Two types of calibration ranges for the Em-Tec […]
EM-Tec FIB pre-tilt stub holders
Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is […]
EM-Tec low profile pin stubs for FIB applications
The low profile pin mounts have been especially developed for FIB/SEM applications to bring samples closely to the pole piece of the FIB/SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub and a flat version of the larger Ø25.0mm pin stub. […]
EM-Tec acrylic Eyelash manipulator sets for ultramicrotomy
Perfectly manufactured Eyelash manipulator sets for carefully manipulating ultra-thin sections, small tissue samples and small microscopy samples. These cost-effective artificial Eyelash manipulator sets are ideally suited for ultramicrotomy to manipulate sections from the diamond knife. They are equally useful for sorting and manipulating sensitive samples under a stereo microscope.The EM-Tec straight acrylic Eyelash manipulator sets […]
EM-Tec sample cryo pin for cryo ultramicrotomes
The EM-Tec cryo pin has a diameter of 2mm and is compatible with the Leica and RMC cryo ultramicrotomes.Made from cryo compatible aluminium; 10mm long and reversed tapered head with a diameter of 3.5mm. Concentric grooves on the sample surface ensure better adhesion. Offered in packages of 10 and 50. EM-Tec sample pin for cryo […]
EM-Tec Ø3mm embedding tubes for TEM sample preparation
The EM-Tec Ø3mm embedding tube for TEM sample preparation are useful when making cross sections of materials for examining in the TEM. The 3mm outer diameter is compatible with the TEM sample holder; the 2mm inside diameter leaves enough space to embed the sample(s). The sample is embedded with a suitable epoxy (such as Hysol […]
UranyLess TEM staining alternative for Uranyl Acetate
UranyLess is an efficient, ready to use staining substitute for uranyl acetate delivering similar results. With Uranyless there is an real alternative to uranyl acetate, without the problems with restrictions, toxicity and waste elimination procedures associated with uranyl acetate. UranyLess is a proprietary mix of multiple lanthanides with a great affinity for biological material and comes […]
EM-Tec and Gilder TEM grid storage boxes
Wide choice of practical TEM grid boxes for short term storage handling, shipping and long term storage of TEM grids and FIB lift-out grids. All offered TEM grid boxes include a clear plastic lid for easy grid location. The individual storage positions are either numbered or indexed for easy retrieval of the TEM grids. The […]
EM-Tec Graphene TEM support films
The EM-Tec graphene TEM support films are extremely thin graphene sheets supported by either lacey carbon or fine mesh copper grids. The EM-Tec graphene supports are available with single, dual, 3-5 and 6-8 layers (sheets) of graphene and cover the 3mm diameter TEM grid. Completely. The usable area of the graphene surface is approximately 75% […]
K-kit wet cell liquid TEM sample holder chamber
The K-kits an easy to use innovative sample holder for liquid specimens. It is a single-use sample holder with a sealable micro-channel between two silicon nitride membranes. The K-kit is made from silicon with Si3N4 membranes, using the latest MEMS technologies. Included with the K-kit is a copper aperture grid to mount the sealed wet […]
EM-Tec Silicon Nitride Support Films and membranes for EM
The EM-Tec silicon nitride membranes are ultra-flat, stress optimised and clean silicon nitride films for TEM applications. The properties of silicon nitride enable producing strong, chemical resistant, carbon-free, low background TEM support films. They are ideal for application such as nano particle imaging, quantitative carbon analysis, chemical experimentation on the support films, real-time chemical reactions […]
EM-TEC Formvar only TEM Support Films
The F- range Formvar only TEM support films are an excellent solution for imaging fragile sections in the TEM including ultra-thin cryo-sections. Formvar offers mechanically stable support films. The Formvar only TEM support films are available on 50, 75,100,200, 300 and 400 mesh copper and nickel grids. See the matrix below for the currently available […]
TEM support films
Wide selection of high quality TEM support films ready-to-use, that allow to save precious time. The traditional formvar- and carbon-based support films are realized with dedicated tools in controlled environment, and they are all checked with a TEM before shipping. The EM-Tec silicon nitride TEM support film are realized with the most recent semiconductor manufacturing […]
Zerostat 3 anti-static instrument
The Zerostat 3 anti-static gun is an effective and professional tool to reduce and remove static charges on insulating surfaces such as plastic, glass, films, porcelain, ceramics, storage boxes etc. It contains a piezo-electric crystal device with a trigger mechanism which generates positive and negative streams of ions. The Zerostat 3 includes a dual cycle […]
EM-Tec FIB lift-out grids
The EM-Tec FIB grids have been devised for lift-out techniques with FIB or SEM/FIB systems. They offer a secure way to attach the TEM lamellas to the posts of the grid. The TEM lamella can then be easily imaged in the SEM/FIB, TEM or used for EBSD analysis. The EM-Tec FIB grids are available in […]
Value-Tec TEM support grids
The cost-efficient Value-Tec electron microscopy support grids are intended for educational, non-criticaland high use applications. These high quality TEM grids are manufactured with the same high production standards as the EM-Tec TEM support grids. However, instead of individual inspection, they are sample inspected per production batch which results in significantly lower costs. Perfect for general […]
Gilder Grids TEM grids in copper, nickel and gold
Gilder Grids TEM grids are precision TEM grids with a wide choice of patterns to support nearly all TEM applications. The Gilder Grids TEM grids are renowned for the unique fine mesh patterns, which extend to 2000 mesh delivering high transparency and small hole sizes. They are available in copper, nickel and gold. All Gilder […]
EM-Tec TEM support grids
The high quality EM-Tec TEM support grids are designed as sturdy and stable support grids. They are available in a variety of materials to suit the application at hand. The materials are the standard copper, nickel, gold and molybdenum and additionally titanium, aluminium and stainless steel. There are two manufacturing processes used for the EM-Tec […]
XAROSA CMOS TEM Camera
The XAROSA brings you to the next level of EM imaging. With its unrivaled 20 megapixel CMOS image sensor it sets new benchmarks in speed, resolution and price performance ratio. Our exciting new TEM CMOS camera XAROSA provides more than 30 frames per second in its full 20 megapixel resolution in live. Utilizing a modern […]
VELETA G3 Camera
Our new versatile VELETA G3 (Model S04U) is the third generation of our successful lens-optically coupled VELETA camera series for the side-entry port of almost any TEM, covering with its 4 megapixel and the new speedy CCD sensor an extremely wide range of applications. Adding now the strength of at least 30 frames per second […]
Oxford EDS Ultim Max for TEM
Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM. Maximised sensitivity Increased throughput Stability at elevated temperatures New drift correction methodology Optimised for biological sample analysis M2T […]
Oxford EDS X-Max for SEM
The X-MaxN Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials. The X-MaxN Silicon Drift Detector is a 20 mm2 X-MaxN provides a superb resolution that is independent of sensor size – specifications guaranteed to ISO15632:2012 The same mechanical geometry inside […]
Oxford EDS Ultim Max for SEM
AZtecLive is a revolutionary new approach to EDS analysis that enables a radical change in the way users perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with your samples. AZtecLive is powered by Ultim Max, the next generation […]
Bruker Quantax EDS for TEM
The new generation of QUANTAX EDS features the XFlash® 6T detector series with active areas of 30 mm2 and 60 mm2 for TEM and STEM. Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results: Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster […]
Bruker Quantax EDS for SEM
The new generation of QUANTAX EDS features the XFlash® 6 detector series with active areas from 10 to 100 mm2. Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results: Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster Save effort […]
EDAX EDS Octane SDD for TEM
EDAX’s Octane SDD Series for the TEM are the world’s first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer. EDAX’s […]
EDAX EDS Elite T for TEM
The Elite T is the next generation EDS system for transmission electron microscopy (TEM) utilizing a fast SDD with state-of-the-art integrated electronics. The unique geometry and powerful quantification routines of the Elite T provide optimized analysis solutions for all TEM applications. The design of the Elite T EDS System provides an optimized geometry to ensure […]
SPT-20
The ion coater, SPT-20, is a device used for coating conductive materials (Au, Pt, Pd, Pt-Pd) onto the sample surfaces by using DC sputtering principle. Non-conductive samples are also used for observation under electron microscopes, and they are used to protect the sample surfaces from the injected electron beam and to help the electron flow. […]
EM-Tec holders and stubs for the JEOL NeoScope table top SEMs
The special selection of EM-Tec sample holders and sample stubs compatible with the JEOL NeoScope table top SEMs allows for increased productivity, quicker sample holding and improved imaging. The standard JEOL NeoScope series table top SEMs comprises X/Y movements of 35mm and allows for a maximum height of 50mm. The standard sample stage provides X/Y […]
TEM sample preparation tools and instruments for cross section samples
Sample preparation for TEM requires thinning the sample so far that it becomes transparent to the electron beam. Mechanical sample thinning must use techniques to avoid deformation of the sample. Mechanical thinning is also used prior to ion-beam thinning for cross sectional samples. For mechanical sample preparation for TEM samples (and in some cases small […]
Premium acoustic blast chillers for laboratories
SBox: Containers for noise reduction The blast chillers have been specifically developed to reduce the noise level generated by vacuum pumps and water chillers (water controllers or chillers) used with SEM, TEM, FIB-SEM, sample preparation and analytical systems. If there is no possibility of moving the vacuum pumps and/or the water cooler to a separate […]
EM-Tec sample stubs and sample holders for Phenom desk top SEMs
The EM-Tec sample holders and sample stubs offered on these pages are fully compatible with the Phenom desk top SEMs. With the specially designed EM-Tec sample holders, you can extend the versatility of the Phenom microscopes, increase productivity and unlock additional applications. They are divided into groups depending on the compatibility of the EM-Tec holders. […]
EM-Tec sample stubs and sample holders for Hitachi table top SEMs
With the special collection of the EM-Tec sample holders and sample stubs compatible with the Hitachi TM4000, TM4000plus, TM3030plus, TM3030, TM3000, TM1000 table top SEMs you can increase productivity, examine a multitude of samples and unlock even more applications. The Hitachi TM series table top SEMs include X/Y stage movement of 35mm and allows for […]
EM-Tec field and lab sampler kits and boxes
The EM-Tec field and lab sampler kits consist of a pin stub, a mounted EM-Tec high purity adhesive carbon tab and an EM-tec SB type storage tube. The pin stub with the adhesive carbon tab are stored in the cap of the storage tube. To protect the adhesive carbon tab against contamination, the carbon tab […]
EM-Tec pin stub storage boxes
The EM-Tec pin stub storage boxes and storage tubes are designed for storing samples on either the standard pin stub or the shorter Zeiss pin stubs. They can be used for sample handling, long term storage, archiving and even for storing pin based sample holders. The larger wooden and clear plastic boxes all comprise a […]
FEI Teneo VolumeScope pin stubs with groove
The FEI Teneo VolumeScope systems uses specially designed sample stubs with a 3.1mm diameter pin. The sample mounted on these pins are used for serial sectioning and serial block-face BSD imaging to create 3D imaging data of the sample structure. The sample area consists of a raised platform with 2mm diameter which sits on a […]
Gatan 3View sample pin stubs, tweezers and storage box
Gatan 3View system SEM pin stubs The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas: standard Ø1.4mm flat as sample area larger Ø2.4mm flat as sample area. These pins are fully […]
EBS Tungsten EM Filaments
The tungsten filaments manufactured by Energy Beam Sciences are used in all major brands of scanning and transmission electron microscopes. These high quality, high stability tungsten EM filaments, also called cathodes or electron emitters, are manufactured to excede the specifications of the original equipment manufacturers. These superior cathodes are made using high quality ceramic dics, exact […]
EM-Tec preparation pods and SEM stub stands
The EM-Tec Preparation pods and SEM stub stands are designed for secure handling of SEM stubs and to avoid confusion when preparing multiple SEM stubs. For the pin stubs a preparation pod is a necessity to hold the pin stub in the correct position. For the JEOL and Hitachi cylinder stubs the EM-Tec SEM stub […]
Adattatori stub campione EM-Tec SEM
Gli adattatori per stub SEM EM-Tec consentono l’uso di tutti i tipi comuni di stub o montaggi SEM nel SEM. I vantaggi degli adattatori per stub EM-Tec SEM convenienti e pratici sono: montaggio del campione indipendente dalla piattaforma SEM risparmia tempo senza ricomporre i campioni utilizzare gli standard di calibrazione e risoluzione montati su stub […]
High purity conductive double sided adhesive carbon tabs and tapes
The high purity double sided conductive adhesive carbon tabs and tapes are especially developed for SEM / EDS applications. The material used for both the tabs and tapes is fully transparent for EDS with only trace amounts of Al and Si. The material is constructed using a non-woven liner coated on both sides with a […]
Standard SEM pin stubs and mounts
We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer’s […]
Anti-vibration tables and platforms
The active and passive vibrations insulating platforms can be adapted to all the SEM and TEM models. Our platforms create the optimal environment, allowing the scanning and transmission electron microscopes operators to obtain high resolution images of biological and non-biological samples, reducing the vibrations in the critical 1-5Hz range, in which microscopes are extremely sensitive. […]
EDAX
EDAX microanalysis
3D Cell Explorer-Fluo
The 3D Cell Explorer-Fluo or “CX-F” is a powerful microscope able to meet your scientific requirements, combining the advantages of the in vivo, non invasive, 3D cellular tomography with the multicanal epifluorescence without labels. This live cell imaging instrument employs a completely label free technique. The CX-F holotomographic microscope allows to combine non invasive 3D […]
3D Cell Explorer
Visualize and discover your cells and tissues in their natural environment. Change the way you do research and look instantly inside living cells in 3D without toxic and expensive reagents. The 3D Cell Explorer allows you to investigate your living cells (bacteria, yeast, protozoa, mammalian) and tissues in real-time and in 3D. Our holographic tomographic […]
UPS
UPS to safeguard your electronic instruments.
Old SEMs Electronics’ Upgrade
Electronics upgrade of your old SEM, new computer, new operating system, new software, new digital controller. Why upgrading an SEM? If you need to acquire high resolution images, together with the original SEM electronic capability If you need to simultaneously acquire SE, BSE, CL, STEM If you need automatic functions such as focus, brightness and […]
Transition Element X-ray Spectrometer (TEXS)
The TEXS HP is a parallel beam spectrometer (PBS) employing capillary optics (replacing the high collection optics (HCO)), which give the spectrometer an energy range from 150 eV to 10 keV (B Kα to Cu Kα). The TEXS is optimized to cover low energy and transition element energies. Intuitive and easy to use TEAM™ software. […]
TENGRA TEM camera
TENGRA is EMSIS’ 5.3 megapixel TEM CCD bottom mounted on-axis camera. This state of the art camera offers a great value solution for all standard TEM image acquisition applications with a strong focus on materials sciences. TENGRA combines a large, sensitive CCD chip with attractively high readout speed, tapered fiber optics and a perfectly matched […]
QUEMESA Camera
11 megapixel bottom-mounted TEM camera The QUEMESA provides everything expected of a high end TEM CCD camera today: the extremely high resolution, very high sensitivity, superior contrast, high frame rates, and a large field of view. These superior properties make the QUEMESA the ideal choice both for biomedical and materials science applications. The most satisfying […]
Phurona Camera
The PHURONA brings you all the interesting specifications of a 12 megapixel CMOS sensor now also for the side-entry port of your TEM. Our 12 megapixel TEM CMOS camera PHURONA (model S12U) for the typical side-entry port (“35mm”) of a TEM provides up to 20 frames per second in its full 12 megapixel resolution, using a […]
MORADA G3 – TEM Camera
The 16 megapixel TEM CCD camera MORADA G3 is the reinvention of the first commercially available high megapixel TEM CCD camera. It offers the best value solution for all TEM image acquisition applications which require an extremely large field of view combined with highest resolution, high frame rates and excellent contrast. The MORADA G3 provides […]
MEGAVIEW G3 – TEM Camera
Our MegaView camera is a synonym for best-price performance ratio of TEM cameras for more than 15 years. The new MegaView G3 (Model S03U) is the 4th generation of our most versatile and reliable side entry TEM camera system MegaView. The pneumatically driven camera fits to the wide-angle (35mm) port of almost all common TEMs. […]
Hikari EBSD Camera
The Hikari EBSD Camera Series is the next generation in electron backscatter diffraction (EBSD) cameras offering outstanding performance across the complete range of EBSD applications. Users no longer have to choose between speed and sensitivity as the Hikari Camera Series offers both. The Hikari Series now includes 3 models: Hikari Pro – up to 600 indexed […]
Forward Scatter Detector (FSD) EBSD
The Hikari Plus and Super electron backscatter diffraction (EBSD) cameras come standard with an integrated forward scatter detector (FSD). The Hikari Pro and DigiView EBSD cameras can be upgraded with a forward scatter detector (FSD) for characterizing material and mineral microstructures in the SEM. Features and Benefits Adjustable detector insertion provides multiple imaging Unique imaging […]
Precious metals targets
Thanks to a strong partnership we can offer targets in gold (999.9 thousandths), palladium (950 thousandths) and every alloy and other precious metal with convenient prices and fast delivery times.
Product 1
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EDAX EDS Octane Elite
The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, […]
EDAX EDS Octane Elect
The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at […]
Refurbished Electron Microscopes
We always have a top quality portfolio available for you. We personally check every component and we guarantee for it, they are perfectly working devices that we sell at low prices, for those who cannot afford a SEM or a last generation TEM. We can bring back to life your tired and bruised electron microscope, […]
LVEM5
The LVEM5 is the uniquely designed benchtop low voltage electron microscope that is small enough to fit anywhere nanoscale imaging is needed. A remarkable imaging tool equipped with TEM, SEM and STEM modes and designed to produce detailed and meaningful image results with unmatched contrast of biologic and soft material samples. The LVEM5 is a […]
LVEM25
The LVEM25 is a fast, compact and powerful transmission electron microscope engineered to seamlessly blend a compact form factor with uncompromised capabilities. This microscope combines the unique LVEM technical features with stronger electron beam penetration and is thus able to image conventionally prepared samples. The LVEM25 is compact enough to be installed in any sized lab […]
Low Energy X-ray Spectrometer (LEXS)
The LEXS is a parallel beam spectrometer (PBS) employing high collection optics (HCO), which enable the spectrometer to efficiently collect X-rays from 80 eV to 2.4 keV (Be K to S K). It is specifically designed for low energy X-ray microanalysis. Intuitive and easy to use TEAM™ software. Compact spectrometer design for easy installation on […]
DigiView EBSD Camera
The DigiView is a versatile high resolution digital camera.The CCD sensor has a particularly high Quantum Efficiency (QE), peaking in the blue-green spectrum for use with an optimized phosphor screen coating, resulting in higher sensitivity for electron backscatter diffraction (EBSD) applications. Noise is significantly reduced using a single stage Peltier cooling system that does not […]
FEMTO2D RESONANT
Femto2D product line involves our firstly developed microscopes that have been on the market for more than 10 years. It involves conventional, modular galvanometer and resonant based two-photon microscopes which are used for both in vivo and in vitro studies. Since 2007, more than 60 Femto2D systems have been installed and being worked around the […]
FEMTO2D-GALVO
Femto2D product line involves our firstly developed microscopes that have been on the market for more than 10 years. It involves conventional, modular galvanometer and resonant based two-photon microscopes which are used for both in vivo and in vitro studies. Since 2007, more than 60 Femto2D systems have been installed and being worked around the […]
FEMTO2D-DUAL
Femto2D product line involves our firstly developed microscopes that have been on the market for more than 10 years. It involves conventional, modular galvanometer and resonant based two-photon microscopes which are used for both in vivo and in vitro studies. Since 2007, more than 60 Femto2D systems have been installed and being worked around the […]
FEMTO Smart
FemtoSmart is the first member of our next-generation two-photon microscope series. In the design, the main goal was to create a totally customizable microscope for in vivo studies with a distinct, charismatic appearance. The special feature of this microscope is the elevated body, which allows extremely free positioning of the sample below the objective. POSITIONING […]
FEMTO 3D AO
Femto3D-AcoustoOptic microscope is the first fast, 3D, two-photon microscope on the market. The microscope is capable of scanning neuronal, dendritic, and other neuropil activities about one million faster as compared to previous realizations within a large (about cubic millimeter) scanning volume with preserved two-photon resolution. The microscope, using electrically tunable crystals, can focus the excitation […]
EM30AX
Magnification x20 ~ x100.000 Acceleration Voltage 1kV ~ 30kV Electron Gun Tungsten Filament (W) Detector SE BSE Detector (Solid type 4 Channel) Stage X: 35mm Y: 35mm Z: 0-60mm T 0 to 45° R: 360° Vacuum System Rotary Pump, Turbo Molecular Pump (Less than 3min) EDS ✔️ Chip 30mm² SDD EDS Detection Element Be(4) to […]
EM30
Magnification x20 ~ x100.000 Acceleration Voltage 1kV~30kV Electron Gun Tungsten Filament (W) Detector SE BSE Detector Solid type 4 Channel Stage X: 35mm Y: 35mm Z: 0-60mm T 0 to 45° R: 360° Vacuum System Rotary Pump, Turbo OS Windows 7 Operation Mouse, Keyboard Dimension 400(W) x 600(L) x 500(H)mm Molecular Pump Less than 3min […]
EM-30AX PLUS
The scanning electron microscope EM-30AX Plus is the advanced version of the ductile EM30PLus for morphological analyses. It is the evolution of the COXEM traditional SEM, easy to use and miniaturized as a table-top instrument, but able to provide performances comparable with those of a much more expensive traditional SEM. The main difference between the […]
EM-30 PLUS
The scanning electron microscope EM-30 Plus is the evolution of the Coxem compact SEM, easy-to-use and miniaturized as a table-top SEM, but with performance comparable to those of the much more expensive traditional SEM. It can be defined as a compact SEM, combining the practicality of table-top SEMs with functions and options that, until today, […]
EDAX EDS Element
The Element Energy Dispersive Spectroscopy (EDS) System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon […]
DV-502 high-vacuum evaporation
A flexible evaporation and polverization system operating in high vacuum, compatible with a wide variety of applications. Sample preparation of high level for highly specialized users and professional laboratories. The DV-502 Thermal Evaporation system evaporates many of the metals and compounds involved in optical coatings, metallization, and electron microscope specimen preparation with no discernible contamination. […]
Desktop PRO
Desktop Pro allows for co-sputtering and deposition of magnetic and/or dielectric materials. The perfect instrument for sample preparation when there is small space in the lab, the Desktop Pro sputtering system, compact and high vacuum, offers a superior productivity while occupying less than 914mm. Sputtering platform designed for the preparation of samples in high vacuum. […]
DESK V HP
The Desk V Sample Preparation system, equipped for both evaporation and sputtering, is a high productivity solution that delivers exceptional, consistent and highly repeatable results.Desk V coating systems are available in two versions: Desk V HP and Desk V TSC. The Desk V TSC, the turbo molecular-pumped sputter coater option, is designed for high resolution […]
CX200Plus
The scanning electron microscope CX200Plus is the evolution of the traditional COXEM SEM. CX200Plus is a powerful and easy to use SEM, able to reach 3nm resolution, to analyze every kind of sample. The traditional COXEM scanning electron microscope is used for a variety of applications, ranging from materials science to life science, always granting […]
Consumables
Consumables and accessories for all your needs. After having accumulated years of experience, we have selected partners that can guarantee the highest quality. Contact us for a quote.
Air compressor
We can provide you with air compressors able to sustain the needs of all your instruments. Our oil-free air compressors are tested in our facility before the installation, in order to grant the best performances for your electron microscopes and all the other instruments.
Cooling units
Cooling units are a crucial instrument for maintaining the stability of the performances of your instruments. Chillers are indispensable in order to stabilize scientific instrumentation, with a very fine temperature control, high efficiency and reliability. For your electron microscopes and all the other applications, we can provide you with chillers that can solve the needs […]
BenchTop Turbo for thermal evaporation
The flexible and compact BenchTop Turbo for thermal evaporation and sample preparation is a powerful, versatile high vacuum evaporation and sputtering system. It is capable of full-range, low-voltage (resistive) thermal evaporation and can produce fine-grained thin films via sputtering for high resolution microscopy applications. The BenchTop Turbo can support up to two sources with optional […]