EM-Tec ZC replaceable ceramic tips tweezers
The EM-Tec ZC replaceable ceramic tips tweezers combine the advantages of the unique high strength/high hardness ceramic tweezers tips with the firm handles of stainless steel tweezers. The material used for the ZC replaceable ceramic tips is a zirconia toughened alumina (ZTA). The ceramic ZC tips exhibit both high strength and high hardness with excellent […]
EM-Tec ZE ESD safe replaceable ceramic tips tweezers
The EM-Tec ZE replaceable ceramic tips tweezers combine the advantages of the unique high strength/high hardness ESD safe ceramic tweezers tips with the firm handles of stainless steel tweezers. The material used for the ESD safe replaceable ceramic tips is a zirconia toughened alumina (ZTA) doped to create an ESD safe static dissipative material. The […]
EM-Tec CT ESD safe replaceable plastic tip tweezers
The EM-Tec replaceable plastic tip tweezers combine the advantages of the soft tip ESD safe tweezers with the firm handles of stainless steel tweezers. The material used for the replaceable plastic tips is the same as for the EM-Tec CT plastic tweezers: ESD safe, tough material with excellent chemical resistance. The handles of the tweezers […]
EM-Tec handling tweezers for cryo grid boxe
# 50-001553 EM-Tec 553.AM cryo grid box handling tweezers, 145mm, anti-magnetic stainless steel The EM-Tec 553.AM precision cryo grid box handling tweezers are especially designed for handling the small cryo grid boxes used for storing TEM grid under liquid nitrogen. They can be used with the EM-Tec GB4 cryo grid box and other cryo grid boxes of […]
EM-Tec SEM stub gripper tweezers
The EM-Tec SEM stub gripper tweezers are specially designed tweezers to securely grip SEM stubs and mounts. With the EM-Tec SEM stub gripper tweezers, SEM sample stubs and mounts can be handled without touching them by hand. Ideal for clean handling and to avoid contamination issues. The SEM stub gripper tweezers are all made from […]
EM-Tec precision wafer handling tweezers
The EM-Tec precision wafer handling tweezers are made from conductive anti-magnetic stainless steel. They exhibit a larger stepped bottom paddle to support the wafer and a clamping top with posts. They are available in sizes for 2”, 4”, 6” and 8” wafers to cover the full range from 1” to 8” wafers. The 2” wafer […]
EM-Tec self-closing high precision reverse action tweezers
The EM-Tec high precision anti-magnetic reverse action tweezers are Swiss made precision engineered high quality tweezers. They are also called self-closing, crossover or X-type tweezers. These excellent self-closing tweezers exhibit smooth edges and a superior matte finish to reduce glare. They are made from a special, low carbon, high strength stainless steel to provide: The […]
EM-Tec high precision super alloy tweezers
The EM-Tec high precision super alloy tweezers are Swiss made precision engineered high quality tweezers with smooth edges and a superior matte finish to reduce glare. These superior tweezers are made from a special Ni-Cr-Mo super alloy. This super alloy is about six times harder than anti-magnetic stainless steel with the highest hardness at the tips. […]
EM-Tec high precision slim tweezers
The EM-Tec high precision slim tweezers are Swiss made precision engineered high quality tweezers with fine tips. They exhibit smooth edges and a superior matte finish to reduce glare. Ideal for reaching into tight places and when working with chemicals or heat sources; they are longer than the standard high precision tweezers. They are made […]
EM-Tec precision anti-magnetic mini tweezers
The EM-Tec high precision mini tweezers are Swiss made precision engineered high quality tweezers with fine tips. They exhibit smooth edges and a superior matte finish to reduce glare. Ideal for working into tight spaces and short range precision work. They are made from a special, low carbon, high strength anti-magnetic stainless steel. This tough […]
EM-Tec high precision anti-magnetic locking tweezers
The EM-Tec high precision anti-magnetic locking tweezers are Swiss made precision engineered high quality tweezers with smooth edges and a superior matte finish to reduce glare. The EM-Tec locking tweezers include a sliding locking mechanism with anti-slip pattern to keep the tweezers tips closed. When the integrated locking slider is moved forwards, arts are held […]
EM-Tec high precision titanium tweezers
The EM-Tec high precision titanium tweezers are Swiss made, precision engineered high quality tweezers with smooth edges and a superior matte finish to reduce glare. They are made from tough, strong and lightweight titanium Grade 1. Titanium exhibits good corrosion resistance to salts, low concentrate acids, solvents, oils and greases. Titanium has a combination of […]
EM-Tec high precision anti-magnetic tweezers
The EM-Tec high precision anti-magnetic tweezers are Swiss made precision engineered high quality tweezers with smooth edges and a superior matte finish to reduce glare. They are made from a special, low carbon, high strength stainless steel. This tough material exhibits good corrosion resistance to salts, low concentrate acids, solvents, oils and greases. Good wear […]
EM-Tec ultra-precision tips biology tweezers
The EM-Tec biology tweezers are Swiss made ultra-precision engineered tweezers with: ultra-precision biology tweezers handle profile, serrated grips, smooth edges and a superior satin polished finish. These superior biology tweezers are made from the C-Star Ni-Cr-Mo super alloy. The profile and shape of the EM-Tec high biology tweezers has been optimised for delicate and ultra-high […]
Micro-Tec black metal microscope slides
Micro-Tec black metal microscope slides are ideal to support metallographic, petrographic and geological embedded samples for reflective light microscopy. The Micro-Tec black metal microscope support slides are made from matt black anodised aluminium. The matt black surface reduces light reflection. The aluminium metal is safe and solid when using a sample levelling press (glass microscope […]
Micro-Tec quartz microscope slides and coverslips
The Micro-Tec quartz microscope slides and coverslips are primarily used for microscopy applications where enhanced UV transparency is needed. Other applications include requirements for improved optical performance, reduced light absorption, high temperature stability, chemical stability and UV radiation transparency. The Micro-tec quartz microscope slides and quartz coverslips are made from type GE124 high purity fused […]
Micro-Tec glass microscope slides
Premier quality Micro-Tec glass microscope slides are made from optically clear and corrosion resistant select quality soda lime glass. All slides comprise precision ground edges are are pre-cleaned. This low iron soda lime glass has no notable interference from UV light in the 250-350nm range. Currently available slides are: standard plain slides, 75 x 25mm, […]
Nano-Tec gold coated microscope slide
The Nano-Tec gold coated microscope slides are intended for microscopy, AFM / SPM, nanotechnology and biotechnology applications. They are also useful as opaque light microscopy supports. The microscope slides are pre-cleaned before coating and coated with a 50nm of Au over a 5nm adhesion layer of Cr. Both Cr and Au are deposited in a […]
Nano-Tec gold coated silicon wafers
The Nano-Tec gold coated silicon wafers are useful for thin film research, AFM / SPM, nanotechnology and biotechnology applications. The silicon wafers are coated with 50nm of pure gold over a 5nm adhesion layer of Cr. Both Cr and Au are deposited in a dedicated high vacuum deposition system with electron beam evaporation sources. The […]
Micro-Tec quartz substrate discs
The Micro-Tec quartz substrate discs are ideal substrates for thin film, high temperature, UV and optical research. They are made from type GE124 high purity fused quartz. The material has excellent chemical resistance against a wide variety of acids, bases and solvents (except hydrofluoric and phosphoric acids). They also exhibit excellent dimensional stability and heat […]
Nano-Tec Muscovite ruby mica discs and sheets
Nano-Tec mica discs and sheets are intended for use with scanning probe microscopy, electron microscopy and thin film applications. The Nano-Tec mica offered is the muscovite sheet type or ruby mica in the highest grade V-1 quality. Selected for its excellent cleavability and lack of inclusions or bubbles. It is transparent or translucent with a […]
EM-Tec silicon SEM finder grid substrate
The novel EM-Tec FG1 silicon SEM finder grid substrate consists of a 12x12mm chrome deposited grid with a 1mm pitch on a conductive ultra-flat silicon substrate. The substrate is divided into 144 indexed fields of 1x1mm where each of the fields has a unique alphanumeric label in the lower right corner. The alphanumeric label is […]
Silicon wafers, substrates and sample supports
Polished silicon is an excellent substrate for imaging, experiments, nanotechnology and micro-fabrication applications. It is available in the form of wafers, diced wafer or as smaller chips (pieces). The silicon wafer and chips all have a <100> orientation. Cleaving of the wafers to the desired size with a <100> orientation wafers is straight forward and […]
Vitreous Carbon Discs and Graphite Discs/Plates
The standard SEM stubs used in an SEM are nearly all made from aluminum and sometimes brass. This is fine for many applications if the sample is large enough and can be mounted directly on the stub. However, for small samples, powders, particles in solutions and fibers the finish and the material of the stub […]
Conductive SEM Coating Fluid
The BEL-1 conductive ionic SEM coating fluid offers a simple and cost-effective alternative for coating non-conductive sample with a conductive surface layer. Instead of using a sputter coater with a precious metal target, the sample needs to be immersed in a diluted conductive SEM coating solution for several minutes. Features of the BEL-1 conductive ionic […]
EM-Tec Quartz Crystals for Thickness Monitors/Controllers
The EM-Tec Quartz crystals are particularly suited for thickness monitors, thickness controllers and quartz crystal microbalances (QCM) used with SEM sputter coaters and EM carbon evaporation systems and vacuum deposition systems. These plano-convex crystals are available in two sizes: Popular 14.0mm (0.55”) in diameter and compatible with thickness measurement, controller and QCM systems using a […]
Carbon rods for carbon evaporation
Ultra high purity carbon rods are used for carbon evaporation in EM applications. Either to coat non-conductive samples with a thin layer of carbon or to produce support films for TEM samples. The structure of the carbon rods is in reality high purity graphite which is formed during the purification process of the rods. The […]
EM-Tec Disc or Annular Sputter Targets for EM Sputter Coaters
The high purity EM-Tec sputter targets are compatible with a wide variety of desk top sputter coaters. The sputter coaters are used to sputter a very thin layer of conductive metal on non-conductive sample in order to investigate these samples with a scanning electron microscope (SEM). The EM-Tec sputter targets are compatible with the following […]
Alumina coated evaporation sources
The alumina coated evaporation baskets are of novel design; combining the benefits of an evaporation basket with an alumina crucible. The result is a range of small alumina crucibles with highly efficient heating characteristics. The alumina coated basket forms an enclosure to hold the molten evaporation material. The power needed to heat this type of […]
EM-Tec metal wires and materials for vacuum evaporation
The EM-Tec high purity wires are especially selected for vacuum coating of EM samples. The wires can be easily cut to size and used in evaporation coils, boats or filaments. The small amount of material and the relatively large contact area with the evaporation sources enables evaporation with low power evaporation power supplies.For shadowing applications […]
EM-Storr vacuum EM sample storage transport shipping containers
Standard size EM-Storr vacuum dessicators The EM-Tec EM-Storr vacuum sample storage container have been specifically developed by us, to store and protect SEM / FIB / TEM samples and calibration standards under vacuum. It protects valuable samples from air, moisture and dust. The superior EM-Storr vacuum container is constructed using high vacuum compatible materials: vacuum […]
Hysol 1C/Torr Seal Vacuum Epoxy Resin Sealant kit
Hysol 1C high vacuum epoxy glue and sealant is ideal for sealing leaks on vacuum systems, bonding vacuum component, repair of vacuum components and to seal electrical feedthroughs on high vacuum systems. Hysol 1C epoxy sealant is fully equivalent to Torr Seal sealant. It is a two- component epoxy resin system with no solvents. Due […]
Vacuum Oil for Rotary Vane Vacuum Pumps
High quality vacuum oils for standard rotary vane vacuum pumps improve the performance of the rotary vacuum pumps used on scanning and transmission electron microscopes, sputter coating systems, vacuum ovens, glow discharge and other vacuum systems. The original brand vacuum pump oils offered are intended for standard rotary vacuum pump applications. Unlimited shelf life when […]
EM-Tec KF – NW – QF vacuum connection hardware, components and parts
The EM-Tec standard KF vacuum flange hardware components and parts are directly compatible with all KF, NW of QF vacuum flange hardware connections. Interchangeable designations for these standard rough and medium vacuum flange connections are: KF, DN-KF, ISO-KF, NW, ISO-NW, QF and DN. The standard sizes offered are: DN10KF (adapts to DN16KF) DN16KF DN25KF DN40KF […]
Micro-Tec Quick-check vacuum test gauges
The Micro-Tec Quick-check vacuum test gauge enables a quick and easy way to test vacuum performance, test pump-down time and determine leaks in vacuum lines. Since the Micro-Tec Quick-check vacuum gauge doesn’t require an external power source, it is ideal for field applications or in remote locations. The Micro-Tec Quick-check vacuum gauge is equally useful […]
Bullseye Precision Portable Vacuum Gauges
The Bullseye portable precision vacuum gauge presents a new level in portable vacuum measurement. With the robust gauges and rugged control units it offers unrivaled flexibility and connectivity. The Bullseye Bluetooth enabled gauges enable monitoring from mobile devices (Android or Apple), alarm settings and documenting vacuum data. This lightweight unit is easy to use in […]
Micro-Tec Individual Graticule Calibration Standards
The new and innovative Micro-Tec individual graticule calibration standards have been designed using an ultra-flat conductive silicon substrate with corrosion resistant Cr lines. They are manufactured utilizing the latest semiconductor manufacturing techniques. The Micro-Tec graticule calibration standards provide high contrast images for ease of calibration. Each of the calibration standards has a unique product ID […]
Stage micrometers and graticules for light microscopy
These high quality precise stage micrometers are intended for calibration of standard light microscopes, digital microscopes, stereo microscopes and eyepiece reticules. Additional graticules are offered for counting, location finders and test patterns.The patterns are manufactured by vacuum deposited chromium lines on glass. The deposited chromium is wear resistant to ensure long term use. The stage […]
AFM/SPM Calibration Standards and Test Gratings
Atomic Force Microscopy (AFM) has become a valuable tool for imaging and accurate measurements on the micrometer and nanometer scale. In order to validate the measuring capabilities, the AFM system need to be correctly calibrated. On this page you will find a selection of affordable and accurate AFM calibration standards for Z-axis and X-Y-axis calibration: […]
TipCheck sample for checking AFM tips
When imaging a sample surface by AFM, it may be difficult to know wether the surface is imaged accurately or if it is affected by a blunt or broken tip. Blunt or broken tips will dramatically distort measurements like surface roughness or feature dimensions. To be certain that a proper AFM tip is used, they […]
EM-Tec B100 Faraday cup for beam current measurements
The EM-Tec B100 Faraday cup has been designed to enable precise beam current measurements on SEM, FESEM, FIB, EPMA or Microprobe systems. Precise beam current measurement are useful for quantititive X-ray analysis and for consistent and reproducible X-ray mappings and line scans.The EM-Tec B100 features a 100µm diameter hole with a wider cavity inside. This […]
EM-Tec CXS calibration and reference standards for EDS, WDS, BSD, CL and Raman
The EM-Tec CXS calibration and reference standards are designed for calibration, resolution testing and performance testing. Each standard contains a selection of reference materials, in the form of element or compounds, optimized for specific calibration tasks.They are available as compact Ø 12.7mm pin stubs and Ø25.4mm discs: Compact Ø12.7mm standard aluminium pin stub with up […]
EM-Tec SEM Resolution Test Standard
Quality resolution standards are essential tools for obtaining optimum resolution, settings, beam size and astigmatism correction on SEM, CD-SEMs, FESEMs, FIB, Microprobe, Auger and SIMS systems. The industry standards are: Gold particles on a carbon substrate Tin spheres on a carbon substrate. Gold particles on carbon have rich features and provide excellent signal strength for […]
EM-Tec M-1 and M-10 Grid Pattern Calibration Standards
The EM-Tec M1 and M-10 calibration standards both have a square mesh type grid pattern etched in the surface of an ultra-flat Si substrate. The grid patterns are practical tools for magnification calibration and image distortion assessments. Intended for use with SEM, FESEM, FIB, Auger, SIMS and reflected light microscopy applications. The specimens can also […]
EM-Tec LAMC-15 large area magnification calibration standard
The unique EM-Tec LAMC-15 calibration standard has been designed for large area and low magnification calibration. It is constructed using an ultra-flat conductive silicon substrate with bright chromium deposited lines. Ideal for SEM and reflected light microscopy with the following applications: low magnification calibration large area magnification calibration particle analysis measurements GSR measurements microscope stage […]
Micro-Tec MTC-5 Multiple Target Graticule Calibration Standards
The new and innovative Micro-Tec MTC-5 multiple target graticule calibration standards have been designed using an ultra-flat conductive silicon substrate with corrosion resistant Chromium lines. The precise patterns are manufactured utilizing the latest semiconductor manufacturing techniques. The Micro-Tec multi target graticules provide bright and rich contrast images for ease of calibration. Intended for use with […]
EM-Tec MCS series magnification calibration standards
The EM-Tec MCS series magnification calibration standards are unique, cost effective, wide range SEM calibration standards. These fullly featured practical calibration standards can be used for magnification calibration or critical dimension measurements in table top SEM, standard SEM, FESEM, FIB, Auger, SIMS and reflected light microscope systems. Two types of calibration ranges for the Em-Tec […]
EM-Tec FIB pre-tilt stub holders
Pre-tilt stub holders are useful for FIB/SEM systems to get the sample perpendicular with the FIB column to allow for straight FIB milling in to the surface of the sample. The pre-tilt angles are complementary to the angles between the FIB column and the electron beam column. When pre-tilt stub holders are used, there is […]
EM-Tec low profile pin stubs for FIB applications
The low profile pin mounts have been especially developed for FIB/SEM applications to bring samples closely to the pole piece of the FIB/SEM systems to enable low working distances. They are available as flat, vertical and complementary tilt versions of the standard Ø12.7mm pin stub and a flat version of the larger Ø25.0mm pin stub. […]
EM-Tec acrylic Eyelash manipulator sets for ultramicrotomy
Perfectly manufactured Eyelash manipulator sets for carefully manipulating ultra-thin sections, small tissue samples and small microscopy samples. These cost-effective artificial Eyelash manipulator sets are ideally suited for ultramicrotomy to manipulate sections from the diamond knife. They are equally useful for sorting and manipulating sensitive samples under a stereo microscope.The EM-Tec straight acrylic Eyelash manipulator sets […]
EM-Tec sample cryo pin for cryo ultramicrotomes
The EM-Tec cryo pin has a diameter of 2mm and is compatible with the Leica and RMC cryo ultramicrotomes.Made from cryo compatible aluminium; 10mm long and reversed tapered head with a diameter of 3.5mm. Concentric grooves on the sample surface ensure better adhesion. Offered in packages of 10 and 50. EM-Tec sample pin for cryo […]
EM-Tec Ø3mm embedding tubes for TEM sample preparation
The EM-Tec Ø3mm embedding tube for TEM sample preparation are useful when making cross sections of materials for examining in the TEM. The 3mm outer diameter is compatible with the TEM sample holder; the 2mm inside diameter leaves enough space to embed the sample(s). The sample is embedded with a suitable epoxy (such as Hysol […]
UranyLess TEM staining alternative for Uranyl Acetate
UranyLess is an efficient, ready to use staining substitute for uranyl acetate delivering similar results. With Uranyless there is an real alternative to uranyl acetate, without the problems with restrictions, toxicity and waste elimination procedures associated with uranyl acetate. UranyLess is a proprietary mix of multiple lanthanides with a great affinity for biological material and comes […]
EM-Tec and Gilder TEM grid storage boxes
Wide choice of practical TEM grid boxes for short term storage handling, shipping and long term storage of TEM grids and FIB lift-out grids. All offered TEM grid boxes include a clear plastic lid for easy grid location. The individual storage positions are either numbered or indexed for easy retrieval of the TEM grids. The […]
EM-Tec Graphene TEM support films
The EM-Tec graphene TEM support films are extremely thin graphene sheets supported by either lacey carbon or fine mesh copper grids. The EM-Tec graphene supports are available with single, dual, 3-5 and 6-8 layers (sheets) of graphene and cover the 3mm diameter TEM grid. Completely. The usable area of the graphene surface is approximately 75% […]
K-kit wet cell liquid TEM sample holder chamber
The K-kits an easy to use innovative sample holder for liquid specimens. It is a single-use sample holder with a sealable micro-channel between two silicon nitride membranes. The K-kit is made from silicon with Si3N4 membranes, using the latest MEMS technologies. Included with the K-kit is a copper aperture grid to mount the sealed wet […]
EM-Tec Silicon Nitride Support Films and membranes for EM
The EM-Tec silicon nitride membranes are ultra-flat, stress optimised and clean silicon nitride films for TEM applications. The properties of silicon nitride enable producing strong, chemical resistant, carbon-free, low background TEM support films. They are ideal for application such as nano particle imaging, quantitative carbon analysis, chemical experimentation on the support films, real-time chemical reactions […]
EM-TEC Formvar only TEM Support Films
The F- range Formvar only TEM support films are an excellent solution for imaging fragile sections in the TEM including ultra-thin cryo-sections. Formvar offers mechanically stable support films. The Formvar only TEM support films are available on 50, 75,100,200, 300 and 400 mesh copper and nickel grids. See the matrix below for the currently available […]
TEM support films
Wide selection of high quality TEM support films ready-to-use, that allow to save precious time. The traditional formvar- and carbon-based support films are realized with dedicated tools in controlled environment, and they are all checked with a TEM before shipping. The EM-Tec silicon nitride TEM support film are realized with the most recent semiconductor manufacturing […]
Zerostat 3 anti-static instrument
The Zerostat 3 anti-static gun is an effective and professional tool to reduce and remove static charges on insulating surfaces such as plastic, glass, films, porcelain, ceramics, storage boxes etc. It contains a piezo-electric crystal device with a trigger mechanism which generates positive and negative streams of ions. The Zerostat 3 includes a dual cycle […]
EM-Tec FIB lift-out grids
The EM-Tec FIB grids have been devised for lift-out techniques with FIB or SEM/FIB systems. They offer a secure way to attach the TEM lamellas to the posts of the grid. The TEM lamella can then be easily imaged in the SEM/FIB, TEM or used for EBSD analysis. The EM-Tec FIB grids are available in […]
Value-Tec TEM support grids
The cost-efficient Value-Tec electron microscopy support grids are intended for educational, non-criticaland high use applications. These high quality TEM grids are manufactured with the same high production standards as the EM-Tec TEM support grids. However, instead of individual inspection, they are sample inspected per production batch which results in significantly lower costs. Perfect for general […]
Gilder Grids TEM grids in copper, nickel and gold
Gilder Grids TEM grids are precision TEM grids with a wide choice of patterns to support nearly all TEM applications. The Gilder Grids TEM grids are renowned for the unique fine mesh patterns, which extend to 2000 mesh delivering high transparency and small hole sizes. They are available in copper, nickel and gold. All Gilder […]
EM-Tec TEM support grids
The high quality EM-Tec TEM support grids are designed as sturdy and stable support grids. They are available in a variety of materials to suit the application at hand. The materials are the standard copper, nickel, gold and molybdenum and additionally titanium, aluminium and stainless steel. There are two manufacturing processes used for the EM-Tec […]
EM-Tec holders and stubs for the JEOL NeoScope table top SEMs
The special selection of EM-Tec sample holders and sample stubs compatible with the JEOL NeoScope table top SEMs allows for increased productivity, quicker sample holding and improved imaging. The standard JEOL NeoScope series table top SEMs comprises X/Y movements of 35mm and allows for a maximum height of 50mm. The standard sample stage provides X/Y […]
TEM sample preparation tools and instruments for cross section samples
Sample preparation for TEM requires thinning the sample so far that it becomes transparent to the electron beam. Mechanical sample thinning must use techniques to avoid deformation of the sample. Mechanical thinning is also used prior to ion-beam thinning for cross sectional samples. For mechanical sample preparation for TEM samples (and in some cases small […]
Premium acoustic blast chillers for laboratories
SBox: Containers for noise reduction The blast chillers have been specifically developed to reduce the noise level generated by vacuum pumps and water chillers (water controllers or chillers) used with SEM, TEM, FIB-SEM, sample preparation and analytical systems. If there is no possibility of moving the vacuum pumps and/or the water cooler to a separate […]
EM-Tec sample stubs and sample holders for Phenom desk top SEMs
The EM-Tec sample holders and sample stubs offered on these pages are fully compatible with the Phenom desk top SEMs. With the specially designed EM-Tec sample holders, you can extend the versatility of the Phenom microscopes, increase productivity and unlock additional applications. They are divided into groups depending on the compatibility of the EM-Tec holders. […]
EM-Tec sample stubs and sample holders for Hitachi table top SEMs
With the special collection of the EM-Tec sample holders and sample stubs compatible with the Hitachi TM4000, TM4000plus, TM3030plus, TM3030, TM3000, TM1000 table top SEMs you can increase productivity, examine a multitude of samples and unlock even more applications. The Hitachi TM series table top SEMs include X/Y stage movement of 35mm and allows for […]
EM-Tec field and lab sampler kits and boxes
The EM-Tec field and lab sampler kits consist of a pin stub, a mounted EM-Tec high purity adhesive carbon tab and an EM-tec SB type storage tube. The pin stub with the adhesive carbon tab are stored in the cap of the storage tube. To protect the adhesive carbon tab against contamination, the carbon tab […]
EM-Tec pin stub storage boxes
The EM-Tec pin stub storage boxes and storage tubes are designed for storing samples on either the standard pin stub or the shorter Zeiss pin stubs. They can be used for sample handling, long term storage, archiving and even for storing pin based sample holders. The larger wooden and clear plastic boxes all comprise a […]
FEI Teneo VolumeScope pin stubs with groove
The FEI Teneo VolumeScope systems uses specially designed sample stubs with a 3.1mm diameter pin. The sample mounted on these pins are used for serial sectioning and serial block-face BSD imaging to create 3D imaging data of the sample structure. The sample area consists of a raised platform with 2mm diameter which sits on a […]
Gatan 3View sample pin stubs, tweezers and storage box
Gatan 3View system SEM pin stubs The Gatan3View systems use special sample pins. These are used inside SEMs to create 3D imaging data of samples by serial slicing and BSD imaging. The sample pins are offered with two sample areas: standard Ø1.4mm flat as sample area larger Ø2.4mm flat as sample area. These pins are fully […]
EBS Tungsten EM Filaments
The tungsten filaments manufactured by Energy Beam Sciences are used in all major brands of scanning and transmission electron microscopes. These high quality, high stability tungsten EM filaments, also called cathodes or electron emitters, are manufactured to excede the specifications of the original equipment manufacturers. These superior cathodes are made using high quality ceramic dics, exact […]
EM-Tec preparation pods and SEM stub stands
The EM-Tec Preparation pods and SEM stub stands are designed for secure handling of SEM stubs and to avoid confusion when preparing multiple SEM stubs. For the pin stubs a preparation pod is a necessity to hold the pin stub in the correct position. For the JEOL and Hitachi cylinder stubs the EM-Tec SEM stub […]
Adattatori stub campione EM-Tec SEM
Gli adattatori per stub SEM EM-Tec consentono l’uso di tutti i tipi comuni di stub o montaggi SEM nel SEM. I vantaggi degli adattatori per stub EM-Tec SEM convenienti e pratici sono: montaggio del campione indipendente dalla piattaforma SEM risparmia tempo senza ricomporre i campioni utilizzare gli standard di calibrazione e risoluzione montati su stub […]
High purity conductive double sided adhesive carbon tabs and tapes
The high purity double sided conductive adhesive carbon tabs and tapes are especially developed for SEM / EDS applications. The material used for both the tabs and tapes is fully transparent for EDS with only trace amounts of Al and Si. The material is constructed using a non-woven liner coated on both sides with a […]
Standard SEM pin stubs and mounts
We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer’s […]
Consumables
Consumables and accessories for all your needs. After having accumulated years of experience, we have selected partners that can guarantee the highest quality. Contact us for a quote.