Oxford EDS Ultim Max for TEM

Ultim Max is the next generation of Silicon Drift Detectors (SDD) utilising our Extreme electronics to generate maximised sensitivity with increased throughput. This powers AZtecTEM, the market-leading software that delivers unparalleled elemental characterisation performance in the TEM. Maximised sensitivity Increased throughput Stability at elevated temperatures New drift correction methodology Optimised for biological sample analysis M2T […]
Oxford EDS X-Max for SEM

The X-MaxN Silicon Drift Detector large area sensor chips, digital signal processing, and innovative packaging deliver the highest sensitivity for accurate analysis of all types of samples including fragile samples and nano-materials. The X-MaxN Silicon Drift Detector is a 20 mm2 X-MaxN provides a superb resolution that is independent of sensor size – specifications guaranteed to ISO15632:2012 The same mechanical geometry inside […]
Oxford EDS Ultim Max for SEM

AZtecLive is a revolutionary new approach to EDS analysis that enables a radical change in the way users perform sample investigation in the SEM. It combines a live electron image with live X-ray chemical imaging to give an intuitive new way of interacting with your samples. AZtecLive is powered by Ultim Max, the next generation […]
Bruker Quantax EDS for TEM

The new generation of QUANTAX EDS features the XFlash® 6T detector series with active areas of 30 mm2 and 60 mm2 for TEM and STEM. Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results: Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster […]
Bruker Quantax EDS for SEM

The new generation of QUANTAX EDS features the XFlash® 6 detector series with active areas from 10 to 100 mm2. Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results: Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster Save effort […]
EDAX EDS Octane SDD for TEM

EDAX’s Octane SDD Series for the TEM are the world’s first SDDs for the TEM that are fully integrated. Data acquisition and signal processing electronics are fully integrated into the detector. The integrated detector presents an elegant design that improves performance, facilitates installation and offers easy remote access via Ethernet from virtually any computer. EDAX’s […]
EDAX EDS Elite T for TEM

The Elite T is the next generation EDS system for transmission electron microscopy (TEM) utilizing a fast SDD with state-of-the-art integrated electronics. The unique geometry and powerful quantification routines of the Elite T provide optimized analysis solutions for all TEM applications. The design of the Elite T EDS System provides an optimized geometry to ensure […]
EDAX EDS Octane Elite

The game changing advancements in the Octane Elite SDDs take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite EDS System also uses state of the art electronics, […]
EDAX EDS Octane Elect

The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at […]
EDAX EDS Element

The Element Energy Dispersive Spectroscopy (EDS) System delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It is focused on the industrial market, where application specific problems need to be solved quickly and accurately. The combination of an Element Silicon […]