{"id":10827,"date":"2020-01-06T10:52:51","date_gmt":"2020-01-06T09:52:51","guid":{"rendered":"https:\/\/m-s.it\/prodotti\/sims-sims-4550\/"},"modified":"2020-03-20T12:02:33","modified_gmt":"2020-03-20T11:02:33","slug":"sims-sims-4550","status":"publish","type":"prodotti","link":"https:\/\/m-s.it\/en\/prodotti\/sims-sims-4550\/","title":{"rendered":"SIMS &#8211; SIMS 4550"},"content":{"rendered":"\n<h5 class=\"wp-block-heading\">Quadrupole SIMS Dopant Depth Profiling and Thin Layer Analysis in Semiconductors<\/h5>\n\n\n\n<p class=\"wp-block-paragraph\">The CAMECA SIMS 4550 offers extended capabilities for ultra shallow depth profiling, trace element and composition measurements of thin layers in Si, high-k, SiGe and other compound materials such as III-V for optical devices.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>High depth resolution and high throughput<\/strong><br>With ever shrinking device dimensions, the implant profiles and layer thickness of today\u2019s semiconductors are often in the range of 1-10nm. The SIMS 4550 has been optimized to address these application fields by offering oxygen and cesium high density primary beam with an impact energy programmable from 5keV down to less than 150eV.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Flexibility<\/strong><br>CAMECA\u2019s SIMS 4550 is a dynamic SIMS tool offering full flexibility in sputter conditions (impact angle, energy, species). With dedicated options for charge compensation (electron gun, laser) during sample sputtering, insulating materials can be easily analyzed. The SIMS 4550 measures layer thickness, alignment, abruptness, integrity, uniformity and stoechiometry. Sample holders can accommodate a variety of samples: small pieces of a few mm\u00b2 up to 100mm diameter sample size.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>High precision and automation<\/strong><br>State-of-the-art quadrupole analyzer optics and superior peak to background performance are key factors for low detection limits for trace elements.&nbsp;The SIMS 4550 offers excellent sensitivity for H, C, N and O thanks to its advanced UHV design with main chamber pressure in the low E-10mbar (E-8Pa) range. Ultra stable ion sources and electronics ensure highest precision and repeatability of measurements down to &lt; 0.2% RSD.<br>The human factor on precision is well taken into consideration by easy-to-use software, predefined recipes, remote operation and trouble shooting. All instrument settings of each measurement are stored in a database. Repeated measurements are therefore only a few mouse clicks away. Further automation features\n\n<\/p>\n","protected":false},"featured_media":51638,"parent":0,"template":"","categoria_prodotto":[314],"class_list":["post-10827","prodotti","type-prodotti","status-publish","has-post-thumbnail","hentry","categoria_prodotto-cameca-en"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.6 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Cameca SIMS - SIMS 4550 - Media System Lab<\/title>\n<meta name=\"description\" content=\"The CAMECA SIMS 4550 offers is a quadrupole SIMS for dopant depth profiling, trace element detection and thin layer analysis in semiconductors.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/m-s.it\/en\/prodotti\/sims-sims-4550\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Cameca SIMS - SIMS 4550 - Media System Lab\" \/>\n<meta property=\"og:description\" content=\"The CAMECA SIMS 4550 offers is a quadrupole SIMS for dopant depth profiling, trace element detection and thin layer analysis in semiconductors.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/m-s.it\/en\/prodotti\/sims-sims-4550\/\" \/>\n<meta property=\"og:site_name\" content=\"Media System Lab\" \/>\n<meta property=\"article:modified_time\" content=\"2020-03-20T11:02:33+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/m-s.it\/wp-content\/uploads\/2020\/01\/CAMECA-SIMS-4550.png\" \/>\n\t<meta property=\"og:image:width\" content=\"1080\" \/>\n\t<meta property=\"og:image:height\" content=\"1080\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:site\" content=\"@MEDIASystemLab\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/\",\"url\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/\",\"name\":\"Cameca SIMS - SIMS 4550 - Media System Lab\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/m-s.it\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/m-s.it\\\/wp-content\\\/uploads\\\/2020\\\/01\\\/CAMECA-SIMS-4550.png\",\"datePublished\":\"2020-01-06T09:52:51+00:00\",\"dateModified\":\"2020-03-20T11:02:33+00:00\",\"description\":\"The CAMECA SIMS 4550 offers is a quadrupole SIMS for dopant depth profiling, trace element detection and thin layer analysis in semiconductors.\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/#primaryimage\",\"url\":\"https:\\\/\\\/m-s.it\\\/wp-content\\\/uploads\\\/2020\\\/01\\\/CAMECA-SIMS-4550.png\",\"contentUrl\":\"https:\\\/\\\/m-s.it\\\/wp-content\\\/uploads\\\/2020\\\/01\\\/CAMECA-SIMS-4550.png\",\"width\":1080,\"height\":1080,\"caption\":\"Il CAMECA SIMS 4550 offre funzionalit\u00e0 estese per profilature di profondit\u00e0, elementi in tracce e misure di composizione di strati sottili in Si, high-k, SiGe e altri materiali composti come III-V per dispositivi ottici.\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/m-s.it\\\/en\\\/prodotti\\\/sims-sims-4550\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\\\/\\\/m-s.it\\\/en\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Prodotti\",\"item\":\"https:\\\/\\\/m-s.it\\\/prodotti\\\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"SIMS &#8211; SIMS 4550\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/m-s.it\\\/#website\",\"url\":\"https:\\\/\\\/m-s.it\\\/\",\"name\":\"Media System Lab\",\"description\":\"Il posto dei microscopisti. 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